Samtec Releases Test Solutions Design and Capabilities guide

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February 2009

Samtec releases Test Solutions Design & Capabilities guide

Samtec has introduced its new Test Solutions Design Guide illustrating the company’s unique signal integrity expertise and extensive product design and development capabilities for new and existing test designs and high speed applications.

Test solutions for new designs include Samtec’s Spirit™ Compression test Probes for Logic and Protocol/Analysis as well as high speed Q Series® and Edge Rate™ systems for Emulation (consolidated signals). In addition, two new high performance RF test points and cable systems (BullsEye™ and IsoRate™) are available ganged or single channel to support both individual and consolidated signal applications. Traditional board level RF connectors and cables and a variety of high speed multipoint isolated transmission line test probes are also available.

Test solutions for existing designs include a choice of high speed connectors, RF systems, and high speed connector extenders. Also discussed are Samtec solutions for high speed silicon applications such as semiconductor verification, high speed test and measurement, and silicon-specific support.

Full engineering support for these high speed systems including design, development, simulation, and testing is also available via Samtec’s Signal Integrity Group.

For your copy of Samtec’s Test Solutions Design Guide, contact: Samtec, Inc. • P.O. Box 1147 • New Albany, IN 47151-1147 • Phone: 1-800-SAMTEC-9 or 812-944-6733 • Fax: 812-948-5047 • Internet: www.samtec.com • E-mail: info@samtec.com.